IRIS
MORANDI, Carlo
 Distribuzione geografica
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Continente #
NA - Nord America 2.019
EU - Europa 1.597
AS - Asia 876
AF - Africa 2
Continente sconosciuto - Info sul continente non disponibili 2
Totale 4.496
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Nazione #
US - Stati Uniti d'America 1.966
CN - Cina 695
IE - Irlanda 411
FI - Finlandia 306
UA - Ucraina 294
SE - Svezia 274
DE - Germania 189
TR - Turchia 148
IT - Italia 55
CA - Canada 53
GB - Regno Unito 36
BE - Belgio 15
SG - Singapore 10
FR - Francia 9
IN - India 6
KR - Corea 5
NL - Olanda 4
HK - Hong Kong 3
EU - Europa 2
JP - Giappone 2
MA - Marocco 2
MO - Macao, regione amministrativa speciale della Cina 2
RU - Federazione Russa 2
TW - Taiwan 2
ES - Italia 1
HR - Croazia 1
ID - Indonesia 1
IR - Iran 1
MY - Malesia 1
Totale 4.496
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Città #
Jacksonville 432
Dublin 411
Chandler 387
Beijing 206
Izmir 146
Dearborn 131
Nanjing 112
Ashburn 92
Princeton 90
San Mateo 89
Ann Arbor 74
Wilmington 55
Toronto 52
Helsinki 42
Kunming 33
Des Moines 32
Shenyang 32
Nanchang 30
Jiaxing 27
Jinan 27
Hebei 24
Changsha 23
Hefei 21
New York 20
Shanghai 20
Tianjin 20
Parma 18
Guangzhou 15
Boardman 13
Woodbridge 13
Brussels 12
Auburn Hills 7
Borås 7
Düsseldorf 7
Norwalk 7
Rockville 7
Fuzhou 6
Seattle 6
Chengdu 5
Hangzhou 5
Scandiano 5
Zhengzhou 5
Ningbo 4
Taizhou 4
Wuhan 4
Xi'an 4
Central 3
Fidenza 3
Fremont 3
Lanzhou 3
Toulouse 3
Wenzhou 3
Baotou 2
Bhopal 2
Caraglio 2
Chongqing 2
Cornuda 2
Herndon 2
Houston 2
Kocaeli 2
Miami 2
Nuremberg 2
Puxian 2
Redmond 2
Reggio Emilia 2
Taipei 2
Taiyuan 2
Tokyo 2
Yeongdeungpo-gu 2
Amiens 1
Bari 1
Dallas 1
Dolianova 1
Edinburgh 1
Falls Church 1
Geislingen an der Steige 1
Genova 1
Grafing 1
Great Sutton 1
Gurgaon 1
Haikou 1
Hendon 1
Herford 1
Huizen 1
Ivanteyevka 1
Jakarta 1
Jinhua 1
Johor Bahru 1
Los Angeles 1
Montalbano 1
Moscow 1
Mountain View 1
Napoli 1
Philadelphia 1
Pozzo Di Gotto 1
Pune 1
Qingdao 1
Quanzhou 1
Quzhou 1
Reston 1
Totale 2.865
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Nome #
Some thoughts on the word error rate measurement of A/D converters 95
IEEE standard for terminology and test methods for Analog-to-Digital Converters 87
Enhancing the time resolution of an EBT system via the primary electron pulse shape measurement 85
An improved code density test for dynamic characterization of A/D converters 82
ADC modeling and testing 79
A Low-Distortion Class G Line Driver for Central-Office ADSL Modem 77
Step and transient rensponse measurement 71
A 10-bit 185 Ms/s Track and Hold in 0.35um CMOS 69
Low Power Transponder for RFID 69
A test structure for transferring timing setup between digital I.C. testers 67
Tecnica di calibrazione degli errori dovuti alla disuniformita` dei condensatori nei convertitori A/D pipeline: analisi delle prestazioni 66
A new method for estimating the aperture uncertainty of A/D converters 66
ADC modeling and testing 65
A 750mW class G ADSL line driver with offset-controlled amplifier hand-over 64
Calibrazione dinamica dei DAC nei convertitori A/D pipeline mediante rotazione dei condensatori di peso. 64
An 8 bit, 200Ms/s,full Nyquist, 3.3V, differential interpolatedflash A/D Converter in BiCMOS technology 63
Hystheresis measurement 62
Estimation of DAC Weighting Capacitors Mismatch in Pipelined ADCs Employing Finite Gain Op-Amps 62
Dynamic Characterization of high-speed latching comparators 61
A 2.5V BiCMOS comparator with current mode interpolation 60
Test setup design for high-speed A/D converters 60
A current mirroring BiCMOS Comparator for Low-Voltage, Low-Power Applications 60
A failure analysis oriented e-beam test system 59
A new method for estimating the aperture uncertainty of A/D converters 58
3.3V, 200Ms/s BiCMOS comparator for current-mode interpolation using a transconductance stage 58
Progetto di un lock-in integrato per la lettura senza contatto di sensori risonanti eccitati magneticamente. 58
Signal and distortion in EBT waveform measurements 56
Messa a punto di un banco di misura per spettroscopia di impedenza su fluidi alimentari 56
Discriminating the intrinsic noise of high-speed latching comparators from the test bench contribution 55
Issues in the design of a test set-up for high-speed A/D converters 54
DAC Calibration by Weighting Capacitor Rotation in a Pipelined ADC 54
PROGETTO DI UN SENSORE RADAR IN BANDA C PER APPLICAZIONI INDUSTRIALI A CORTO-RAGGIO 54
A CMOS vector lock-in amplifier for sensor applications 54
Code histogram test 53
Analysis of distortion in A/D converters by time-domain and code-density techniques 53
Requirements for a correct estimation of A/D converter signal-to-noise ratio in dynamic conditions 53
Bayesian classification of machined surface finishing by 2 D analysis of diffraction patterns 53
Registration of rotated and translated images using finite Fourier transforms 53
Observation of latch up phenomena in CMOS ICs by means of digital differential voltage contrast 53
Dynamic testing of high speed A/D converters 51
A PC AT based system for the acquisition of SEM images 51
Digital Image Registration Using Projections 51
High-Speed, Low-Power BiCMOS Comparator using a pMOSVariable Load 50
Inductive fault analysis revisited 50
DYNAD: a framework IV SMT project addressed to the development of dynamic test techniques for analog-to-digital converters 49
Image registration using Fermat Transforms 49
About the number of records to be acquired for histogram testing of A/D converters using synchronous sinewave and clock generators 49
Preparation and characterization of lead zirconate titanate thin films by sol gel techniques: effect of heat treatment 48
An Universal Audio Preamplifier with active offset cancellationin a 2.0um BiCMOS technology 48
Assessing monoplane camera calibration accuracy with off-the-self hardware 47
Band-Gap References for Near 1-V Operation in Standard CMOS technology 47
Mixed High-Level and circuital simulationof Current-Driven Loudspeaker systems 45
A comparison of Ti/Pt and TiN/Pt electrodes used with ferroelectric SrBi2Ta2O9 films 45
Compensation of random eye motion in a television ophthalmoscope: preliminary results 44
On the design of easily testable LFSR counters for frequency division 43
Correlation between deposition conditions and defect structures in Sol-Gel lead zirconate titanate films 43
Non-linear digital audio processor for dedicated loudspeaker systems 42
Uncertainties in Quantization Noise Estimates for Analog-to-Digital Converters 42
A novel coding schemesfor the ROM of parallel ADCs, featuring reduced conversion noisein the case of single bubbles in the thermometer code 42
Enhancing the time resolution of an EBT system via the primary electron pulse shape measurement 42
Jitter analysis of A/D converters 42
Low-Power, low-voltage BiCMOS comparators for200MHz, 8bit operation 41
Inverse numerical filters for linearisation of loudspeaker's response 40
Robust 1-D equivalent of phase correlation image registration algorithm 40
ECL fault modelling 40
Functional simulation of a technique for background calibration of capacitor mismatch errors in pipelined A/D converters 40
High Slew Rate, high gain OperationalAmplifier driving large capacitive loads in a BiCMOS high voltagetechnology 39
Current Mode BiCMOS Comparator forinterpolated, high speed, low voltage A/D converters 39
Digital image registration by phase correlation between boundary maps 39
Low-power implementation of a Sigma-Delta decimation filter for cardiac applications 39
Enhancing the time resolution of an EBT system via the primary electron pulse shape measurement 38
Signal and distortion in EBT waveform measurements 38
Measuring rotation in SEM images of integrated circuits 38
The influence of low temperature baking on the properties of SrBi2Ta2O9 films from metallorganic solutions 37
Restoration of short voltage glitches by deconvolution for the diagnosis of IC failures using EBT 37
Experimental validation of loudspeaker equalization inside car cockpits 37
Integrated Lock-In Amplifier for Contactless Interface to Magnetically Stimulated Mechanical Resonators 37
Non-linear digital audio processor for dedicated loudspeaker systems 35
Measuring rotation in SEM images of integrated circuits 35
Harmonic distortion in High Speed DifferentialA/D converters 35
Experiments on monoplane camera calibration accuracy 35
EU-ASEAN Credit Transfer System in Engineering: Developing a Quality Assurance Instrument in the Field of inter-regional Student Mobility 34
Performances and limitations of a technique for background calibration of capacitor mismatch errors in pipelined A/D converters. 34
Comparison of Curricular Content for the Electrical, Electronics and Computer Engineering Bachelor Program within European-ASEAN Credit Transfer System (EACTS) Network 32
The EU- ASEAN Credit Transfer System in Engineering Education 32
Information package as facilitating tool for student mobility in European-Asian Credit Transfer System (EACTS) student exchange program. 32
A Novel Inversion Technique for Imaging Thrombus Volume in Microchannels Fusing Optical and Impedance Data 31
I.C. testing: problems and trends 30
High frequency fatigue testing of ferroelectric thin films 25
Low-power, low-voltage BiCMOS comparators for approx.200MHz, 8bit operation 24
Totale 4.521
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Categoria #
all - tutte 14.824
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 14.824
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2018/2019180 0 0 0 0 0 0 0 0 0 0 173 7
2019/20201.222 204 207 94 7 116 94 147 17 119 103 26 88
2020/2021515 6 90 38 5 84 8 52 2 116 9 96 9
2021/2022430 4 2 2 13 11 6 74 81 21 39 26 151
2022/20231.348 184 121 73 91 110 138 7 75 501 5 27 16
2023/2024326 24 76 17 9 32 91 39 12 20 6 0 0
Totale 4.521