This paper presents the design of a low-power, low-voltage latched comparator, suitable for current-mode interpolation, using transconductors instead of current mirrors. Thanks to this approach, higher immunity to device mismatch and overall improved dynamic performance were achieved. The proposed comparator was integrated in a 0.8 μm bipolar complementary metal-oxide-semiconductor technology and implemented in a 200 Ms/s analog/digital converter with 8 bit resolution on a 1 V differential range at 3.3 V supply

3.3V, 200Ms/s BiCMOS comparator for current-mode interpolation using a transconductance stage / Boni, Andrea; G., Melcher; Morandi, Carlo. - In: IEEE JOURNAL OF SOLID-STATE CIRCUITS. - ISSN 0018-9200. - 33:(1998), pp. 1563-1567. [10.1109/4.720405]

3.3V, 200Ms/s BiCMOS comparator for current-mode interpolation using a transconductance stage

BONI, Andrea;MORANDI, Carlo
1998-01-01

Abstract

This paper presents the design of a low-power, low-voltage latched comparator, suitable for current-mode interpolation, using transconductors instead of current mirrors. Thanks to this approach, higher immunity to device mismatch and overall improved dynamic performance were achieved. The proposed comparator was integrated in a 0.8 μm bipolar complementary metal-oxide-semiconductor technology and implemented in a 200 Ms/s analog/digital converter with 8 bit resolution on a 1 V differential range at 3.3 V supply
1998
3.3V, 200Ms/s BiCMOS comparator for current-mode interpolation using a transconductance stage / Boni, Andrea; G., Melcher; Morandi, Carlo. - In: IEEE JOURNAL OF SOLID-STATE CIRCUITS. - ISSN 0018-9200. - 33:(1998), pp. 1563-1567. [10.1109/4.720405]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11381/2436066
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