The word error rate (WER) of an A/D converter quantifies the probability that a wrong output code occurs because of metastability, intrinsic noise or aperture uncertainty. It can be measured in real-time, as it is customary for very low WER converters, or by post processing, when the WER is more relevant. In the paper the possible causes of inaccuracy are analyzed. First, the existing methods are reviewed, then the errors which may arise from the conventional analysis of experimental data are discussed, and it is shown that these errors can be removed in the case of post processing. Finally, the requirements on the test bench noise are discussed in connection with the qualified error level (i.e. 1, 2, 4, .., 16 LSB) and with the expected error rate

Some thoughts on the word error rate measurement of A/D converters / Chiorboli, Giovanni; B., De Salvo; Franco, Giovanni; Morandi, Carlo. - 3:(1998), pp. 453-456. ((Intervento presentato al convegno IEEE International Conference on Electronics, Circuits and Systems, ICECS 1998 tenutosi a Lisbon, Portugal nel September 7-10, 1998.

Some thoughts on the word error rate measurement of A/D converters

CHIORBOLI, Giovanni;FRANCO, Giovanni;MORANDI, Carlo
1998-01-01

Abstract

The word error rate (WER) of an A/D converter quantifies the probability that a wrong output code occurs because of metastability, intrinsic noise or aperture uncertainty. It can be measured in real-time, as it is customary for very low WER converters, or by post processing, when the WER is more relevant. In the paper the possible causes of inaccuracy are analyzed. First, the existing methods are reviewed, then the errors which may arise from the conventional analysis of experimental data are discussed, and it is shown that these errors can be removed in the case of post processing. Finally, the requirements on the test bench noise are discussed in connection with the qualified error level (i.e. 1, 2, 4, .., 16 LSB) and with the expected error rate
0780350081
Some thoughts on the word error rate measurement of A/D converters / Chiorboli, Giovanni; B., De Salvo; Franco, Giovanni; Morandi, Carlo. - 3:(1998), pp. 453-456. ((Intervento presentato al convegno IEEE International Conference on Electronics, Circuits and Systems, ICECS 1998 tenutosi a Lisbon, Portugal nel September 7-10, 1998.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11381/2434886
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