Aperture uncertainty measurements are strongly influenced by quantization, converter nonlinearity and test setup noise. An original method is here proposed which completely solves the difficulties arising from quantization and nonlinearity. The method estimates the noise distribution function by finely varying the input signal offset. The applicability of the method is proved by the experimental results obtained on 8 and 10 bit converters
Titolo: | A new method for estimating the aperture uncertainty of A/D converters |
Autori: | |
Data di pubblicazione: | 1997 |
Abstract: | Aperture uncertainty measurements are strongly influenced by quantization, converter nonlinearity and test setup noise. An original method is here proposed which completely solves the difficulties arising from quantization and nonlinearity. The method estimates the noise distribution function by finely varying the input signal offset. The applicability of the method is proved by the experimental results obtained on 8 and 10 bit converters |
Handle: | http://hdl.handle.net/11381/2434848 |
ISBN: | 0780337476 |
Appare nelle tipologie: | 4.1b Atto convegno Volume |
File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.