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EnglishAperture uncertainty measurements are strongly influenced by quantization, converter nonlinearity and test setup noise. An original method is here proposed which completely solves the difficulties arising from quantization and nonlinearity. The method estimates the noise distribution function by finely varying the input signal offset. The applicability of the method is proved by the experimental results obtained on 8 and 10 bit converters
A new method for estimating the aperture uncertainty of A/D converters / G. Chiorboli; M. Fontanili; C. Morandi. - 1(1997), pp. 632-635. ((Intervento presentato al convegno IEEE Instrumentation and Measurement Technology Conference, IMTC 97 tenutosi a Ottawa, Canada nel May 19-21, 1997.
| Titolo: | A new method for estimating the aperture uncertainty of A/D converters | |
| Autori: | ||
| Data di pubblicazione: | 1997 | |
| Citazione: | A new method for estimating the aperture uncertainty of A/D converters / G. Chiorboli; M. Fontanili; C. Morandi. - 1(1997), pp. 632-635. ((Intervento presentato al convegno IEEE Instrumentation and Measurement Technology Conference, IMTC 97 tenutosi a Ottawa, Canada nel May 19-21, 1997. | |
| Abstract: | Aperture uncertainty measurements are strongly influenced by quantization, converter nonlinearity and test setup noise. An original method is here proposed which completely solves the difficulties arising from quantization and nonlinearity. The method estimates the noise distribution function by finely varying the input signal offset. The applicability of the method is proved by the experimental results obtained on 8 and 10 bit converters | |
| Handle: | http://hdl.handle.net/11381/2434848 | |
| ISBN: | 0780337476 | |
| Appare nelle tipologie: | 4.1b Atto convegno Volume |
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