IRIS
MARRAS, Alessandro
 Distribuzione geografica
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Continente #
NA - Nord America 698
EU - Europa 571
AS - Asia 291
Totale 1.560
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Nazione #
US - Stati Uniti d'America 672
CN - Cina 196
IE - Irlanda 120
UA - Ucraina 118
SE - Svezia 112
FI - Finlandia 92
DE - Germania 58
SG - Singapore 57
GB - Regno Unito 28
CA - Canada 26
TR - Turchia 21
BE - Belgio 17
IR - Iran 15
AT - Austria 9
IT - Italia 8
LT - Lituania 5
NL - Olanda 3
IN - India 2
PL - Polonia 1
Totale 1.560
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Città #
Dublin 120
Jacksonville 120
Chandler 95
Ann Arbor 62
Beijing 47
Dearborn 43
Singapore 39
Boardman 35
Nanjing 34
Ashburn 28
San Mateo 28
Princeton 24
Izmir 21
Toronto 21
Brussels 17
Woodbridge 16
Shanghai 15
Wilmington 15
Helsinki 14
Hefei 11
Kunming 10
Nanchang 9
Shenyang 9
Vienna 9
Jinan 8
Los Angeles 7
Hebei 5
Parma 5
Zanjan 5
Changsha 4
Guangzhou 4
Jiaxing 4
London 4
Norwalk 4
Ottawa 4
Santa Clara 4
Zhengzhou 4
Ardabil 3
Bremen 3
Düsseldorf 3
Kashan 3
Seattle 3
Taizhou 3
Andover 2
Auburn Hills 2
Augusta 2
Chengdu 2
Des Moines 2
Frankfurt am Main 2
Fremont 2
Hangzhou 2
Mumbai 2
Tianjin 2
Wuhan 2
Xian 2
Buffalo 1
Chongqing 1
Grafing 1
Huizen 1
Huzhou 1
Leawood 1
Monmouth Junction 1
Nanning 1
Puxian 1
Sabz 1
Sacramento 1
Taiyuan 1
Tappahannock 1
Warsaw 1
Wenzhou 1
Winnipeg 1
Totale 962
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Nome #
Advances in Radiation Active Pixel Sensors (RAPS) Architectures 139
Advanced active pixel architectures in standard CMOS technology 93
Design and test of innovative CMOS pixel detectors 89
High-resolution CMOS particle detectors: design and test issues 88
RAPS: an Innovative Active Pixel for Particle Detection Integrated in CMOS Technology 79
Active Pixel Detectors in CMOS Technology 77
Design and test of innovative CMOS pixel detectors 73
Design, Fabrication, and Test of CMOS Active-Pixel Radiation Sensors 64
MAPS with advanced on-pixel processing 64
DESIGN OF CMOS-APS RADIATION DETECTORS FOR HIGH-ENERGY PHYSICS APPLICATIONS 62
CMOS-APS for HEP applications: design and test of innovative architectures 62
Device Simulations of Silicon Detectors: a Design Perpective 62
ACTIVE PIXEL SENSOR ARCHITECTURES IN STANDARD CMOS TECHNOLOGY FOR CHARGED-PARTICLE DETECTION 60
Characterization of CMOS Active Pixel Sensor featuring non-epitaxial substrate with different radioacive sources 60
A LASER SYSTEM FOR CHARACTERIZING CMOS ACTIVE PIXEL SENSORS 55
Reliability Assessment of Multi-Via Cu-Damascene Structures by Wafer-Level Isothermal Electromigration Tests 53
Radiation Detectors for HEP Applications Using Standard CMOS Technology 52
Device Simulations of Silicon Detectors: a Design Perspective 52
A Laser System for Characterizing CMOS Active Pixel Sensors 50
RAPS: an Innovative Active Pixel for Particle Detection Integrated in CMOS Technology 49
Performance Evaluation of Ultra Thin gate Oxide CMOS Circuits 48
Impact of gate-leakage currents on CMOS circuit performance 45
Modeling of MOSFET gate Currents 44
Architetture avanzate per sensori di radiazione CMOS a Pixel attivi 44
Totale 1.564
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Categoria #
all - tutte 5.711
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 5.711
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020233 0 0 0 0 31 38 56 14 39 18 8 29
2020/2021201 1 25 28 2 24 3 28 0 41 6 40 3
2021/2022150 4 0 1 16 0 2 26 24 5 10 23 39
2022/2023437 51 33 37 31 28 46 2 38 146 4 9 12
2023/2024112 9 16 3 3 8 20 8 3 6 10 5 21
2024/202597 2 25 28 30 12 0 0 0 0 0 0 0
Totale 1.564