MARRAS, Alessandro
 Distribuzione geografica
Continente #
NA - Nord America 646
EU - Europa 556
AS - Asia 235
Totale 1.437
Nazione #
US - Stati Uniti d'America 624
CN - Cina 195
IE - Irlanda 120
UA - Ucraina 118
SE - Svezia 112
FI - Finlandia 92
DE - Germania 56
GB - Regno Unito 23
CA - Canada 22
TR - Turchia 21
BE - Belgio 16
IR - Iran 15
AT - Austria 9
IT - Italia 7
IN - India 2
NL - Olanda 2
SG - Singapore 2
PL - Polonia 1
Totale 1.437
Città #
Dublin 120
Jacksonville 120
Chandler 95
Ann Arbor 62
Beijing 47
Dearborn 43
Nanjing 34
Ashburn 28
San Mateo 28
Princeton 24
Izmir 21
Toronto 19
Brussels 16
Woodbridge 16
Shanghai 15
Wilmington 15
Helsinki 14
Hefei 11
Kunming 10
Nanchang 9
Shenyang 9
Vienna 9
Boardman 8
Jinan 8
Los Angeles 7
Hebei 5
Parma 5
Zanjan 5
Changsha 4
Guangzhou 4
Jiaxing 4
Norwalk 4
Zhengzhou 4
Ardabil 3
Bremen 3
Düsseldorf 3
Kashan 3
Seattle 3
Taizhou 3
Andover 2
Auburn Hills 2
Augusta 2
Chengdu 2
Des Moines 2
Fremont 2
Hangzhou 2
Mumbai 2
Ottawa 2
Tianjin 2
Wuhan 2
Xian 2
Buffalo 1
Chongqing 1
Grafing 1
Huizen 1
Huzhou 1
Leawood 1
London 1
Monmouth Junction 1
Nanning 1
Puxian 1
Sabz 1
Sacramento 1
Singapore 1
Taiyuan 1
Tappahannock 1
Warsaw 1
Wenzhou 1
Winnipeg 1
Totale 883
Nome #
Advances in Radiation Active Pixel Sensors (RAPS) Architectures 128
Advanced active pixel architectures in standard CMOS technology 86
High-resolution CMOS particle detectors: design and test issues 85
Design and test of innovative CMOS pixel detectors 84
RAPS: an Innovative Active Pixel for Particle Detection Integrated in CMOS Technology 75
Active Pixel Detectors in CMOS Technology 70
Design and test of innovative CMOS pixel detectors 68
Design, Fabrication, and Test of CMOS Active-Pixel Radiation Sensors 60
MAPS with advanced on-pixel processing 60
Device Simulations of Silicon Detectors: a Design Perpective 59
CMOS-APS for HEP applications: design and test of innovative architectures 57
ACTIVE PIXEL SENSOR ARCHITECTURES IN STANDARD CMOS TECHNOLOGY FOR CHARGED-PARTICLE DETECTION 55
Characterization of CMOS Active Pixel Sensor featuring non-epitaxial substrate with different radioacive sources 55
A LASER SYSTEM FOR CHARACTERIZING CMOS ACTIVE PIXEL SENSORS 51
DESIGN OF CMOS-APS RADIATION DETECTORS FOR HIGH-ENERGY PHYSICS APPLICATIONS 51
Radiation Detectors for HEP Applications Using Standard CMOS Technology 48
Reliability Assessment of Multi-Via Cu-Damascene Structures by Wafer-Level Isothermal Electromigration Tests 48
Device Simulations of Silicon Detectors: a Design Perspective 48
Performance Evaluation of Ultra Thin gate Oxide CMOS Circuits 44
RAPS: an Innovative Active Pixel for Particle Detection Integrated in CMOS Technology 44
A Laser System for Characterizing CMOS Active Pixel Sensors 44
Impact of gate-leakage currents on CMOS circuit performance 41
Modeling of MOSFET gate Currents 40
Architetture avanzate per sensori di radiazione CMOS a Pixel attivi 40
Totale 1.441
Categoria #
all - tutte 4.579
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 4.579


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2018/201937 0 0 0 0 0 0 0 0 0 0 30 7
2019/2020368 53 53 28 1 31 38 56 14 39 18 8 29
2020/2021201 1 25 28 2 24 3 28 0 41 6 40 3
2021/2022150 4 0 1 16 0 2 26 24 5 10 23 39
2022/2023437 51 33 37 31 28 46 2 38 146 4 9 12
2023/202486 9 16 3 3 8 20 8 3 6 10 0 0
Totale 1.441