In this work, design, implementation and test phases of a radiation sensor based on active pixel architectures are discussed. Fully standard CMOS technology has been exploited, allowing for easier integration of signal-processing circuitry. Alternative circuit schemes have been considered; a novel architecture, called WIPS, is introduced, aimed at a more efﬁcient sparse-access mode of the sensor array. A ﬁrst prototype of the chip has been fabricated, in a 0:18mm CMOS technology. An automatic testing procedure has been devised, including design and fabrication of a suitable test board and of an optical bench. Preliminary results of the measurements are given, validating the overall approach and the operatingprinciple of the WIPS architecture.
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