Sfoglia per Autore
Influence of guiding testability measure on number of backtracksof ATPG program
1989-01-01 Chiorboli, Giovanni; A., Ferrari
Restoration of short voltage glitches by deconvolution for the diagnosis of IC failures using EBT
1990-01-01 Chiorboli, Giovanni; Morandi, Carlo
Measuring rotation in SEM images of integrated circuits
1991-01-01 Chiorboli, Giovanni; G., Demaldè; Morandi, Carlo
Measuring the impulse response of an EBT system
1991-01-01 Chiorboli, Giovanni; D., Devenuto; S., Martino
Signal and distortion in EBT waveform measurements
1991-01-01 Chiorboli, Giovanni; Morandi, Carlo
I.C. testing: problems and trends
1992-01-01 Morandi, Carlo; Chiorboli, Giovanni
Preparation and characterization of lead zirconate titanate thin films by sol gel techniques: effect of heat treatment
1992-01-01 F., Leccabue; B. E., Watts; A., Motta; E., Melioli; Morandi, Carlo; F., Fantini; Chiorboli, Giovanni; G., Franco
Experiments on monoplane camera calibration accuracy
1992-01-01 Chiorboli, Giovanni; Morandi, Carlo; M., Vascotto
Interpretation of life test results on DHBC InGaAs/InP laser diodes
1992-01-01 Chiorboli, Giovanni; Fantini, Fausto; M., Tesauri; M. C., Ronchini; F., Magistrali; D., Sala; Vanzi, Massimo
Electrical characterization for failure analysis of DHBC InGaAsP/InP laser diodes
1992-01-01 Chiorboli, Giovanni; M., Vanzi; M. C., Ronchini; F., Fantini
Signal and distortion in EBT waveform measurements
1992-01-01 Chiorboli, Giovanni; Morandi, Carlo
Measuring the impulse response of an EBT system
1992-01-01 Chiorboli, Giovanni; D., Devenuto; S., Martino
Measuring rotation in SEM images of integrated circuits
1992-01-01 Chiorboli, Giovanni; G., Demaldè; Morandi, Carlo
Enhancing the time resolution of an EBT system via the primary electron pulse shape measurement
1993-01-01 F., Corsi; Chiorboli, Giovanni; D., De Venuto; Morandi, Carlo; G. V., Portacci
Enhancing the time resolution of an EBT system via the primary electron pulse shape measurement
1993-01-01 F., Corsi; Chiorboli, Giovanni; D., De Venuto; Morandi, Carlo; G. V., Portacci
Fatigue behaviour of ferroelectric thin films for non-volatile memories
1993-01-01 Chiorboli, Giovanni; F., Mori; F., Leccabue; B. E., Watts
Very high temperature test of InP-based laser diodes
1993-01-01 M., Tesauri; Chiorboli, Giovanni; Cova, Paolo; F., Fantini; F., Magistrali; D., Sala
In-situ diagnostics of pulsed laser ablation deposition of ferroelectric Pb(Ti0.48Zr0.52)O3 on Si
1993-01-01 A., Iembo; F., Fuso; M., Allegrini; E., Arimondo; V., Berardi; N., Spinelli; F., Leccabue; B. E., Watts; G., Franco; Chiorboli, Giovanni
A test structure for transferring timing setup between digital I.C. testers
1993-01-01 L., Allodi; Chiorboli, Giovanni; G., Franco; Morandi, Carlo; F., Venturi
Comments on Design of Fiducials for Accurate RegistrationUsing Machine Vision
1993-01-01 Chiorboli, Giovanni; G. P., Vecchi
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
Influence of guiding testability measure on number of backtracksof ATPG program | 1-gen-1989 | Chiorboli, Giovanni; A., Ferrari | |
Restoration of short voltage glitches by deconvolution for the diagnosis of IC failures using EBT | 1-gen-1990 | Chiorboli, Giovanni; Morandi, Carlo | |
Measuring rotation in SEM images of integrated circuits | 1-gen-1991 | Chiorboli, Giovanni; G., Demaldè; Morandi, Carlo | |
Measuring the impulse response of an EBT system | 1-gen-1991 | Chiorboli, Giovanni; D., Devenuto; S., Martino | |
Signal and distortion in EBT waveform measurements | 1-gen-1991 | Chiorboli, Giovanni; Morandi, Carlo | |
I.C. testing: problems and trends | 1-gen-1992 | Morandi, Carlo; Chiorboli, Giovanni | |
Preparation and characterization of lead zirconate titanate thin films by sol gel techniques: effect of heat treatment | 1-gen-1992 | F., Leccabue; B. E., Watts; A., Motta; E., Melioli; Morandi, Carlo; F., Fantini; Chiorboli, Giovanni; G., Franco | |
Experiments on monoplane camera calibration accuracy | 1-gen-1992 | Chiorboli, Giovanni; Morandi, Carlo; M., Vascotto | |
Interpretation of life test results on DHBC InGaAs/InP laser diodes | 1-gen-1992 | Chiorboli, Giovanni; Fantini, Fausto; M., Tesauri; M. C., Ronchini; F., Magistrali; D., Sala; Vanzi, Massimo | |
Electrical characterization for failure analysis of DHBC InGaAsP/InP laser diodes | 1-gen-1992 | Chiorboli, Giovanni; M., Vanzi; M. C., Ronchini; F., Fantini | |
Signal and distortion in EBT waveform measurements | 1-gen-1992 | Chiorboli, Giovanni; Morandi, Carlo | |
Measuring the impulse response of an EBT system | 1-gen-1992 | Chiorboli, Giovanni; D., Devenuto; S., Martino | |
Measuring rotation in SEM images of integrated circuits | 1-gen-1992 | Chiorboli, Giovanni; G., Demaldè; Morandi, Carlo | |
Enhancing the time resolution of an EBT system via the primary electron pulse shape measurement | 1-gen-1993 | F., Corsi; Chiorboli, Giovanni; D., De Venuto; Morandi, Carlo; G. V., Portacci | |
Enhancing the time resolution of an EBT system via the primary electron pulse shape measurement | 1-gen-1993 | F., Corsi; Chiorboli, Giovanni; D., De Venuto; Morandi, Carlo; G. V., Portacci | |
Fatigue behaviour of ferroelectric thin films for non-volatile memories | 1-gen-1993 | Chiorboli, Giovanni; F., Mori; F., Leccabue; B. E., Watts | |
Very high temperature test of InP-based laser diodes | 1-gen-1993 | M., Tesauri; Chiorboli, Giovanni; Cova, Paolo; F., Fantini; F., Magistrali; D., Sala | |
In-situ diagnostics of pulsed laser ablation deposition of ferroelectric Pb(Ti0.48Zr0.52)O3 on Si | 1-gen-1993 | A., Iembo; F., Fuso; M., Allegrini; E., Arimondo; V., Berardi; N., Spinelli; F., Leccabue; B. E., Watts; G., Franco; Chiorboli, Giovanni | |
A test structure for transferring timing setup between digital I.C. testers | 1-gen-1993 | L., Allodi; Chiorboli, Giovanni; G., Franco; Morandi, Carlo; F., Venturi | |
Comments on Design of Fiducials for Accurate RegistrationUsing Machine Vision | 1-gen-1993 | Chiorboli, Giovanni; G. P., Vecchi |
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