The reliability of DHBC and DFB InGaAsP/InP lasers has been evaluated by means of high-temperature operating life tests between 80 and 110 °C. The main failure mechanisms have been related to the stability of the active layer, thus demonstrating the applicability of these high temperatures to the evaluation of InP-based lasers.
Very high temperature test of InP-based laser diodes / M., Tesauri; Chiorboli, Giovanni; Cova, Paolo; F., Fantini; F., Magistrali; D., Sala. - In: QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL. - ISSN 0748-8017. - 9:(1993), pp. 377-382. [10.1002/qre.4680090425]
Very high temperature test of InP-based laser diodes
CHIORBOLI, Giovanni;COVA, Paolo;
1993-01-01
Abstract
The reliability of DHBC and DFB InGaAsP/InP lasers has been evaluated by means of high-temperature operating life tests between 80 and 110 °C. The main failure mechanisms have been related to the stability of the active layer, thus demonstrating the applicability of these high temperatures to the evaluation of InP-based lasers.File in questo prodotto:
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