A test methodology for linear modeling of subranging analog-to-digital converters with digital correction is proposed. A reduced physical model of integral nonlinearity errors is obtained by the application of the ambiguity algorithm. Simulation results are provided which demonstrate that a sensible reduction of the number of test points can be obtained, thus reducing the high costs of testing, with low prediction errors

Test and diagnosis of subranging A/D converters / Boni, Andrea; Chiorboli, Giovanni; Franco, Giovanni. - 2:(1996), pp. 1304-1307. ((Intervento presentato al convegno IEEE Instrum. and Meas. Technology Conf. IMTC96 tenutosi a Brussels, Belgium nel June 4-6, 1996.

Test and diagnosis of subranging A/D converters

BONI, Andrea;CHIORBOLI, Giovanni;FRANCO, Giovanni
1996-01-01

Abstract

A test methodology for linear modeling of subranging analog-to-digital converters with digital correction is proposed. A reduced physical model of integral nonlinearity errors is obtained by the application of the ambiguity algorithm. Simulation results are provided which demonstrate that a sensible reduction of the number of test points can be obtained, thus reducing the high costs of testing, with low prediction errors
0780333128
Test and diagnosis of subranging A/D converters / Boni, Andrea; Chiorboli, Giovanni; Franco, Giovanni. - 2:(1996), pp. 1304-1307. ((Intervento presentato al convegno IEEE Instrum. and Meas. Technology Conf. IMTC96 tenutosi a Brussels, Belgium nel June 4-6, 1996.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11381/2434817
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