A test methodology for linear modeling of subranging analog-to-digital converters with digital correction is proposed. A reduced physical model of integral nonlinearity errors is obtained by the application of the ambiguity algorithm. Simulation results are provided which demonstrate that a sensible reduction of the number of test points can be obtained, thus reducing the high costs of testing, with low prediction errors
Test and diagnosis of subranging A/D converters / Boni, Andrea; Chiorboli, Giovanni; Franco, Giovanni. - 2:(1996), pp. 1304-1307. (Intervento presentato al convegno IEEE Instrum. and Meas. Technology Conf. IMTC96 tenutosi a Brussels, Belgium nel June 4-6, 1996).
Test and diagnosis of subranging A/D converters
BONI, Andrea;CHIORBOLI, Giovanni;FRANCO, Giovanni
1996-01-01
Abstract
A test methodology for linear modeling of subranging analog-to-digital converters with digital correction is proposed. A reduced physical model of integral nonlinearity errors is obtained by the application of the ambiguity algorithm. Simulation results are provided which demonstrate that a sensible reduction of the number of test points can be obtained, thus reducing the high costs of testing, with low prediction errorsI documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
