This paper reports on the development of a hybrid approach to electro-thermal modeling of power device assemblies, suitable for reliability-oriented thermal design of power modules and converters. The temperature-dependent electrical model of a power MOSFET is self-consistently coupled with a dynamic lumped-element thermal network representing the die - package - heat-sink assembly and convective boundary conditions. The lumped-element network elements are calculated on the basis of geometrical dimensions and materials physical characteristics. The results of the lumped-element model are compared with thermal measurements in both steady-state and transient conditions. The model is compared with measurement result over an extended time scale, ranging from microseconds to tens of minutes. © 2011 Elsevier Ltd. All rights reserved.

Dynamic electro-thermal modeling for power device assemblies / Cova, Paolo; Bernardoni, Mirko; Delmonte, Nicola; Menozzi, Roberto. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 51:(2011), pp. 1948-1953. [10.1016/j.microrel.2011.06.016]

Dynamic electro-thermal modeling for power device assemblies

COVA, Paolo;BERNARDONI, Mirko;DELMONTE, Nicola;MENOZZI, Roberto
2011-01-01

Abstract

This paper reports on the development of a hybrid approach to electro-thermal modeling of power device assemblies, suitable for reliability-oriented thermal design of power modules and converters. The temperature-dependent electrical model of a power MOSFET is self-consistently coupled with a dynamic lumped-element thermal network representing the die - package - heat-sink assembly and convective boundary conditions. The lumped-element network elements are calculated on the basis of geometrical dimensions and materials physical characteristics. The results of the lumped-element model are compared with thermal measurements in both steady-state and transient conditions. The model is compared with measurement result over an extended time scale, ranging from microseconds to tens of minutes. © 2011 Elsevier Ltd. All rights reserved.
2011
Dynamic electro-thermal modeling for power device assemblies / Cova, Paolo; Bernardoni, Mirko; Delmonte, Nicola; Menozzi, Roberto. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 51:(2011), pp. 1948-1953. [10.1016/j.microrel.2011.06.016]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11381/2358476
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