We propose a torsion magnetometer for magnetic thin films exploiting the mechanical resonance of a cantilever beam. It is driven by the torque exerted on the sample by an AC field applied perpendicularly to the film plane. Sensitivities of the order of 0.5×10−11 A m2 can be in principle achieved. We describe the first experimental set-up and discuss test experiments.
The activated torsion oscillation magnetometer (ATOM): a new high sensitivity magnetometer for thin films / G., Asti; Ghidini, Massimo; R., Pellicelli; Solzi, Massimo. - In: JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS. - ISSN 0304-8853. - 242-245:(2002), pp. 984-986. [10.1016/S0304-8853(01)01132-5]
The activated torsion oscillation magnetometer (ATOM): a new high sensitivity magnetometer for thin films
GHIDINI, Massimo;SOLZI, Massimo
2002-01-01
Abstract
We propose a torsion magnetometer for magnetic thin films exploiting the mechanical resonance of a cantilever beam. It is driven by the torque exerted on the sample by an AC field applied perpendicularly to the film plane. Sensitivities of the order of 0.5×10−11 A m2 can be in principle achieved. We describe the first experimental set-up and discuss test experiments.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
