Correlations between microstructure, mechanical properties, and electrical conductivity (EC) in additively manufactured Ti-6Al-4 V produced by LPBF and EBM are key factors in engineering design. The different thermal histories inherent to these processes lead to distinct phase compositions and morphologies, ranging from tempered α’-martensitic structures in LPBF to α + β microstructures in both EBM and LPBF samples solution-treated at 1050 °C. These variations directly influence properties: yield strength (YS) decreases from (997 ± 13) MPa to (809 ± 11) MPa, and ultimate tensile strength (UTS) from (1059 ± 15) MPa to (924 ± 9) MPa, while EC increases by 12% from the lowest value of 0.5428 MS/m. A clear linear relationship between hardness and yield strength was also observed, including when both properties were normalized by EC.
On electrical conductivity and mechanical properties of Ti6Al4V alloy produced by LPBF and EBM: role of microstructure / Ghio, E., Cerri, E., Curti, L.. - In: MATERIALS LETTERS. - ISSN 0167-577X. - 421:(2026). [10.1016/j.matlet.2026.141046]
On electrical conductivity and mechanical properties of Ti6Al4V alloy produced by LPBF and EBM: role of microstructure
Ghio, Emanuele;Cerri, Emanuela;Curti, Lorenzo
2026-01-01
Abstract
Correlations between microstructure, mechanical properties, and electrical conductivity (EC) in additively manufactured Ti-6Al-4 V produced by LPBF and EBM are key factors in engineering design. The different thermal histories inherent to these processes lead to distinct phase compositions and morphologies, ranging from tempered α’-martensitic structures in LPBF to α + β microstructures in both EBM and LPBF samples solution-treated at 1050 °C. These variations directly influence properties: yield strength (YS) decreases from (997 ± 13) MPa to (809 ± 11) MPa, and ultimate tensile strength (UTS) from (1059 ± 15) MPa to (924 ± 9) MPa, while EC increases by 12% from the lowest value of 0.5428 MS/m. A clear linear relationship between hardness and yield strength was also observed, including when both properties were normalized by EC.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
