This paper presents a new equivalent model based on the Arrhenius law in MATLAB/Simulink environment that can be exploited to evaluate the aging of Li-ion batteries. In this work, we show the simulation results obtained using this model. In addition, an automated test bench for multiple Li-ion battery cell characterization and accelerated aging will be presented together with early measurement results for validating the model.

Aging modelling of Li-ion battery systems based on accelerated tests / Toscani, A.; Stighezza, M.; Simonazzi, M.; Delmonte, N.; Cova, P.; Bianchi, V.; De Munari, I.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 171:(2025). [10.1016/j.microrel.2025.115795]

Aging modelling of Li-ion battery systems based on accelerated tests

Toscani, A.;Stighezza, M.;Simonazzi, M.;Delmonte, N.;Cova, P.;Bianchi, V.;De Munari, I.
2025-01-01

Abstract

This paper presents a new equivalent model based on the Arrhenius law in MATLAB/Simulink environment that can be exploited to evaluate the aging of Li-ion batteries. In this work, we show the simulation results obtained using this model. In addition, an automated test bench for multiple Li-ion battery cell characterization and accelerated aging will be presented together with early measurement results for validating the model.
2025
Aging modelling of Li-ion battery systems based on accelerated tests / Toscani, A.; Stighezza, M.; Simonazzi, M.; Delmonte, N.; Cova, P.; Bianchi, V.; De Munari, I.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 171:(2025). [10.1016/j.microrel.2025.115795]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11381/3023873
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