A hidden defect D affecting the interface in a layered specimen is evaluated from temperature maps collected on its top side. An explicit formula that approximates thermal conductance of the damaged interface is derived by means of first order Thin Plate Approximation. This formula is used to obtain a geometrical description of D from experimental data.
Thermal imaging of inaccessible interfaces / Scalbi, A; Bozzoli, F; Cattani, L; Inglese, G; Malavasi, M; Olmi, R. - In: INFRARED PHYSICS & TECHNOLOGY. - ISSN 1350-4495. - 125:(2022), p. 104268. [10.1016/j.infrared.2022.104268]
Thermal imaging of inaccessible interfaces
Bozzoli, F;Cattani, L;Inglese, G;Malavasi, M;
2022-01-01
Abstract
A hidden defect D affecting the interface in a layered specimen is evaluated from temperature maps collected on its top side. An explicit formula that approximates thermal conductance of the damaged interface is derived by means of first order Thin Plate Approximation. This formula is used to obtain a geometrical description of D from experimental data.File in questo prodotto:
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