Special issue on reliability of new technologies for power electronics (Si and wide band gap devices, interconnections, passives, analysis and applications): Editorial / Cova, P.; Iannuzzo, F.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 124(2021), p. 114326.114326. [10.1016/j.microrel.2021.114326]

Special issue on reliability of new technologies for power electronics (Si and wide band gap devices, interconnections, passives, analysis and applications): Editorial

Cova P.;
2021

Special issue on reliability of new technologies for power electronics (Si and wide band gap devices, interconnections, passives, analysis and applications): Editorial / Cova, P.; Iannuzzo, F.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 124(2021), p. 114326.114326. [10.1016/j.microrel.2021.114326]
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11381/2896198
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