Special issue on reliability of new technologies for power electronics (Si and wide band gap devices, interconnections, passives, analysis and applications): Editorial / Cova, P.; Iannuzzo, F.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 124:(2021), p. 114326.114326. [10.1016/j.microrel.2021.114326]
Special issue on reliability of new technologies for power electronics (Si and wide band gap devices, interconnections, passives, analysis and applications): Editorial
Cova P.
;
2021-01-01
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