Dependences of the evaporation temperature and the growth rate on minimal condensation temperature of polycrystalline CdS films in chemical molecular-beam deposition are discussed. The effect of the evaporation rate and the substrate temperature on the morphology of films has been studied.
Characterization of CdTe and CdS Films for Photoresistors / Razykov, T. M.; Bosio, A.; Romeo, N.; Ergashev, B. A.; Mavlonov, A. A.; Usmonov, A. Y.; Esanov, S. A.. - In: APPLIED SOLAR ENERGY. - ISSN 1934-9424. - 55:1(2019), pp. 1-4. [10.3103/S0003701X19010110]
Characterization of CdTe and CdS Films for Photoresistors
Bosio A.;Romeo N.;
2019-01-01
Abstract
Dependences of the evaporation temperature and the growth rate on minimal condensation temperature of polycrystalline CdS films in chemical molecular-beam deposition are discussed. The effect of the evaporation rate and the substrate temperature on the morphology of films has been studied.File in questo prodotto:
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