Laser induced transient current technique (LI-TCT) was proven to be a successful tool for measuring at the same time carrier lifetime, carrier mobility, and electric field distribution in X- and gamma ray detectors with plain contacts on opposite surfaces. Unfortunately, the most performing detectors exploit more complicated contact geometries that, hindering hole contribution to signal formation, allow a much better spectroscopy. In this paper, a LI-TCT based method is presented, for the determination of transport parameters as well as electric field distribution directly in single carrier devices. The method's validity is demonstrated in twin CdZnTe detectors having similar material properties, but different weighting potentials.
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