This paper presents an experimental study of the main causes of scrap during the production of a typical midrange loudspeaker. After analyzing the most critical components of a transducer, various samples with reference and defected components have been built and characterized in terms of frequency response and distortion. In addition, a second set of samples has been built using reference components but varying the assembly process parameters; these samples also have been characterized as the previous ones. Measurements have been performed both in an anechoic chamber and in a real production line and, by the analysis of acquired data, the authors have individuated the most influential components and assembly parameters in terms of required performance.

Loudspeakers performance variance due to components and assembly process / Bellini, MARIA COSTANZA; Farina, Angelo. - ELETTRONICO. - 142:9714(2017). (Intervento presentato al convegno 142 AES Convention tenutosi a Berlino nel 19-22 May 2017).

Loudspeakers performance variance due to components and assembly process

BELLINI, MARIA COSTANZA
;
FARINA, Angelo
2017-01-01

Abstract

This paper presents an experimental study of the main causes of scrap during the production of a typical midrange loudspeaker. After analyzing the most critical components of a transducer, various samples with reference and defected components have been built and characterized in terms of frequency response and distortion. In addition, a second set of samples has been built using reference components but varying the assembly process parameters; these samples also have been characterized as the previous ones. Measurements have been performed both in an anechoic chamber and in a real production line and, by the analysis of acquired data, the authors have individuated the most influential components and assembly parameters in terms of required performance.
2017
978-1-510843-52-3
Loudspeakers performance variance due to components and assembly process / Bellini, MARIA COSTANZA; Farina, Angelo. - ELETTRONICO. - 142:9714(2017). (Intervento presentato al convegno 142 AES Convention tenutosi a Berlino nel 19-22 May 2017).
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11381/2826651
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