Tetragonal MnxGa1-x (x = 0.70, 0.75) thin films grown on SrTiO3 substrates exhibit perpendicular magnetic anisotropy with coercive fields between 1 and 2 T. Transmission electron microscopy (TEM) and X-ray diffraction (XRD) reveal that 40 nm samples grown at 300-350 °C lead to films with the tetragonal c-axis oriented primarily perpendicular to the film plane but with some fraction of the sample exhibiting the c-axis in the film plane. This structure results in an undesirable secondary magnetic component in the out of plane magnetization. Growth at 300 °C with a reduced thickness or Mn concentration significantly decreases the tetragonal c-axis in the film plane.
Evidence for in-plane tetragonal c-axis in MnxGa1-x thin films using transmission electron microscopy / Karel, J., Casoli, F., Lupo, P., Nasi, L., Fabbrici, S., Righi, L., Albertini, F., Felser, C.. - In: SCRIPTA MATERIALIA. - ISSN 1359-6462. - 114:(2016), pp. 165-169. [10.1016/j.scriptamat.2015.11.019]
Evidence for in-plane tetragonal c-axis in MnxGa1-x thin films using transmission electron microscopy
CASOLI, FRANCESCA;LUPO, Pierpaolo;FABBRICI, Simone;RIGHI, Lara;
2016-01-01
Abstract
Tetragonal MnxGa1-x (x = 0.70, 0.75) thin films grown on SrTiO3 substrates exhibit perpendicular magnetic anisotropy with coercive fields between 1 and 2 T. Transmission electron microscopy (TEM) and X-ray diffraction (XRD) reveal that 40 nm samples grown at 300-350 °C lead to films with the tetragonal c-axis oriented primarily perpendicular to the film plane but with some fraction of the sample exhibiting the c-axis in the film plane. This structure results in an undesirable secondary magnetic component in the out of plane magnetization. Growth at 300 °C with a reduced thickness or Mn concentration significantly decreases the tetragonal c-axis in the film plane.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
