Wide-bandgap power switches, based on SiC and GaN, are emerging on the semiconductor market. Standard resistor drivers are insufficient to exploit all the advantages of these new devices. Fine control over current and voltage waveforms during switching, equivalent on-state resistance and immunity to noisy environments, demand the development of dedicated drivers. This study aims at determining a suitable control topology for the gate (or base) terminal of the power device, in order to enact regulation of the switching waveforms and performances. Four different topologies, both open- and closed-loop are simulated, examined, and compared with the standard resistor driver.

Comparing Control Topologies for Wide-Bandgap Power-Device Drivers: a Simulation Study / Soldati, A.; Barater, D.; Concari, C.; Franceschini, G.. - CD-ROM. - (2015), pp. 2469-2474. ((Intervento presentato al convegno IEEE IECON 2015 tenutosi a Yokohama, Japan nel November 9-12, 2015 [10.1109/IECON.2015.7392473].

Comparing Control Topologies for Wide-Bandgap Power-Device Drivers: a Simulation Study

SOLDATI, ALESSANDRO;BARATER, Davide;CONCARI, Carlo;FRANCESCHINI, Giovanni
2015

Abstract

Wide-bandgap power switches, based on SiC and GaN, are emerging on the semiconductor market. Standard resistor drivers are insufficient to exploit all the advantages of these new devices. Fine control over current and voltage waveforms during switching, equivalent on-state resistance and immunity to noisy environments, demand the development of dedicated drivers. This study aims at determining a suitable control topology for the gate (or base) terminal of the power device, in order to enact regulation of the switching waveforms and performances. Four different topologies, both open- and closed-loop are simulated, examined, and compared with the standard resistor driver.
978-147991762-4
Comparing Control Topologies for Wide-Bandgap Power-Device Drivers: a Simulation Study / Soldati, A.; Barater, D.; Concari, C.; Franceschini, G.. - CD-ROM. - (2015), pp. 2469-2474. ((Intervento presentato al convegno IEEE IECON 2015 tenutosi a Yokohama, Japan nel November 9-12, 2015 [10.1109/IECON.2015.7392473].
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11381/2798386
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