We report a multi-element study by dynamic and quantitative secondary ion mass spectrometry (SIMS) of impurities in CdTe/CdS/TCO/glass solar cell structures. The data obtained for O, CI, Pb, Si, In, Cu, Sb, Zn, Na, and Sn were compared and discussed.

On the origin of impurities in the window layers of CdTe/CdS solar cells / Emziane, M; Durose, K; Halliday, D. P.; Bosio, Alessio; Romeo, Nicola. - STAMPA. - 223:(2006), pp. 257-260. (Intervento presentato al convegno NATO ASI tenutosi a Sozopol, Bulgaria nel 3-15 June, 2005).

On the origin of impurities in the window layers of CdTe/CdS solar cells

BOSIO, Alessio;ROMEO, Nicola
2006-01-01

Abstract

We report a multi-element study by dynamic and quantitative secondary ion mass spectrometry (SIMS) of impurities in CdTe/CdS/TCO/glass solar cell structures. The data obtained for O, CI, Pb, Si, In, Cu, Sb, Zn, Na, and Sn were compared and discussed.
2006
9781402045936
On the origin of impurities in the window layers of CdTe/CdS solar cells / Emziane, M; Durose, K; Halliday, D. P.; Bosio, Alessio; Romeo, Nicola. - STAMPA. - 223:(2006), pp. 257-260. (Intervento presentato al convegno NATO ASI tenutosi a Sozopol, Bulgaria nel 3-15 June, 2005).
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11381/2468636
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