The Kitagawa-Takahashi (K-T) diagram, implemented by the El Haddad equation, relates the conventional fatigue limit to the crack size, enabling a boundary for the cyclic stress range to be established, below which an infinite life of the structural component may be, theoretically, ensured for any crack size due to the non-propagation of micro- and macrocracks. In order to account for the inherent random character of the fatigue phenomenon in real materials and the need of extending the K-T applicability to any prefixed number of cycles, advanced probabilistic S-N models should be considered to define the fatigue limit. In this way, a new basis towards a probabilistic Kitagawa-Takahashi-El Haddad approach is provided in agreement with the asymptotic matching proposed by Ciavarella-Monno.

Towards a probabilistic concept of the Kitagawa-Takahashi diagram / A., Fernández Canteli; Brighenti, Roberto; E., Castillo. - ELETTRONICO. - (2012), pp. 1041-1048. (Intervento presentato al convegno 4th International Conference on Crack Paths (CP 2012) tenutosi a Gaeta (Italy) nel 19 - 21 September, 2012).

Towards a probabilistic concept of the Kitagawa-Takahashi diagram

BRIGHENTI, Roberto;
2012-01-01

Abstract

The Kitagawa-Takahashi (K-T) diagram, implemented by the El Haddad equation, relates the conventional fatigue limit to the crack size, enabling a boundary for the cyclic stress range to be established, below which an infinite life of the structural component may be, theoretically, ensured for any crack size due to the non-propagation of micro- and macrocracks. In order to account for the inherent random character of the fatigue phenomenon in real materials and the need of extending the K-T applicability to any prefixed number of cycles, advanced probabilistic S-N models should be considered to define the fatigue limit. In this way, a new basis towards a probabilistic Kitagawa-Takahashi-El Haddad approach is provided in agreement with the asymptotic matching proposed by Ciavarella-Monno.
2012
9788895940441
Towards a probabilistic concept of the Kitagawa-Takahashi diagram / A., Fernández Canteli; Brighenti, Roberto; E., Castillo. - ELETTRONICO. - (2012), pp. 1041-1048. (Intervento presentato al convegno 4th International Conference on Crack Paths (CP 2012) tenutosi a Gaeta (Italy) nel 19 - 21 September, 2012).
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11381/2386001
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