The object of the present paper is to describe the morphological and crystalline characteristics of ZnS:Mn thin films grown on different low melting point metallic substrates such as Pb, Bi and Bi(1-x)Sbx alloys by a new method based on the quasi-rheotaxy technique. In this paper we also prove that the quasi-rheotaxy deposition technique yields high quality ZnS:Mn thin films without the so called dead layer and without the conical pattern typical of the most common deposition techniques. (C) 1999 Elsevier Science S.A. All rights reserved.
High quality ZnS:Mn thin films grown by quasi-rheotaxy for electroluminescent devices / Romeo, Nicola; Cozzi, S; Tedeschi, Riccardo Alfredo Arturo; Bosio, Alessio; Canevari, V; Tagliente, M. A.; Pensa, M.. - In: THIN SOLID FILMS. - ISSN 0040-6090. - 348:1-2(1999), pp. 49-55. [10.1016/S0040-6090(99)00009-7]
High quality ZnS:Mn thin films grown by quasi-rheotaxy for electroluminescent devices
ROMEO, Nicola;TEDESCHI, Riccardo Alfredo Arturo;BOSIO, Alessio;
1999-01-01
Abstract
The object of the present paper is to describe the morphological and crystalline characteristics of ZnS:Mn thin films grown on different low melting point metallic substrates such as Pb, Bi and Bi(1-x)Sbx alloys by a new method based on the quasi-rheotaxy technique. In this paper we also prove that the quasi-rheotaxy deposition technique yields high quality ZnS:Mn thin films without the so called dead layer and without the conical pattern typical of the most common deposition techniques. (C) 1999 Elsevier Science S.A. All rights reserved.| File | Dimensione | Formato | |
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