We present a novel simulation tool for optical systems employing in-line nonlinear SOAs, able to correctly estimate the bit error rate even in the presence of significant SOA-induced intersymbol interference.
Statistical Characterization of Bit Patterning in SOAs: BER Prediction and Experimental Validation / A., Ghazisaeidi; F., Vacondio; Bononi, Alberto; L. A., Rusch. - ELETTRONICO. - (2009), pp. OWE7.1-OWE7.3. (Intervento presentato al convegno Optical Fiber Conference 2009 tenutosi a San Diego, CA nel Mar. 2009) [10.1364/OFC.2009.OWE7].
Statistical Characterization of Bit Patterning in SOAs: BER Prediction and Experimental Validation
BONONI, Alberto;
2009-01-01
Abstract
We present a novel simulation tool for optical systems employing in-line nonlinear SOAs, able to correctly estimate the bit error rate even in the presence of significant SOA-induced intersymbol interference.File in questo prodotto:
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