La0.7Sr0.3MnO3 polycrystalline manganite thin films were grown on silicon (Si) substrates covered by SiOx amorphous native oxide. Curie temperatures of about 325 K were achieved for 70-nm-thick films. Strong room temperature XMCD signal was detected indicating high spin polarization at the surface. Cross-sectional TEM images show sharp interface between SiOx and manganite without signature of chemical reaction at the interface. Unusual sharp splitting of the manganite film was observed: on the top of a transition layer characterized by low crystalline order, a magnetically robust layer is formed.
Spin polarized La0.7Sr0.3MnO3 thin films on silicon / BERGENTI I; DEDIU V; ARISI E; CAVALLINI M; BISCARINI F; TALIANI C; DE JONG M; DENNIS C.L; GREGG J.F; SOLZI M.; NATALI M. - In: JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS. - ISSN 0304-8853. - 312(2007), pp. 453-457. [10.1016/j.jmmm.2006.11.221]
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