This work reports on the results obtained from numerical simulations of cturrent density, temperature and temperature gradient distributions along test strtuctures designed for the evaluation of electromigration. In partictular, the thermal flux crowding effect and the conditions under which a temperature gradient peak builds up are reported. The influeilce of the bending radius of the structure is also taken into account.
Electrical and Thermal Local Effects Simulation for Electromigration / M., Borgarino; A., Castagnini; DE MUNARI, Ilaria; F., Fantini. - STAMPA. - (1996), pp. 921-924. (Intervento presentato al convegno European Solid State Device Research Conference (ESSDERC) tenutosi a Bologna, Italy nel September 9-11).
Electrical and Thermal Local Effects Simulation for Electromigration
DE MUNARI, Ilaria;
1996-01-01
Abstract
This work reports on the results obtained from numerical simulations of cturrent density, temperature and temperature gradient distributions along test strtuctures designed for the evaluation of electromigration. In partictular, the thermal flux crowding effect and the conditions under which a temperature gradient peak builds up are reported. The influeilce of the bending radius of the structure is also taken into account.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
