We report a multi-element study by dynamic and quantitative secondary ion mass spectrometry (SIMS) of impurities in CdTe/CdS/TCO/glass solar cell structures. The data obtained for O, Cl, Pb, Si, In, Cu, Sb, Zn, Na, and Sn were compared and discussed.
On the origin of impurities in the window layers of CdTe/CdS solar cells / Emziane, M; Durose, K; Halliday, D. P.; Bosio, Alessio; Romeo, Nicola. - ELETTRONICO. - (2006), pp. 257-260. (Intervento presentato al convegno Nato advanced study institute on functional properties of nanostructured materials tenutosi a Sozopol-Bulgaria nel 3-15 June).
On the origin of impurities in the window layers of CdTe/CdS solar cells.
BOSIO, Alessio
;ROMEO, NicolaMembro del Collaboration Group
2006-01-01
Abstract
We report a multi-element study by dynamic and quantitative secondary ion mass spectrometry (SIMS) of impurities in CdTe/CdS/TCO/glass solar cell structures. The data obtained for O, Cl, Pb, Si, In, Cu, Sb, Zn, Na, and Sn were compared and discussed.File in questo prodotto:
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