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Titolo Data di pubblicazione Autore(i) File
A software tool for thermal simulation and rating evaluation of high power silicon devices 1-gen-2004 Pampili, P.; Portesine, M.; Cova, Paolo; Sozzi, Giovanna
Temperature-dependent breakdown and hot carrier stress of PHEMTs 1-gen-2004 Cova, Paolo; Delmonte, Nicola; Sozzi, Giovanna; Menozzi, Roberto
High reliable high power diode for welding applications 1-gen-2004 Cova, Paolo; Fasce, F; Pampili, P.; Portesine, M.; Sozzi, Giovanna; Zani, P. E.
Electro-thermal simulation of press-pack silicon resistors for high power application 1-gen-2005 Delmonte, Nicola; Cova, Paolo; Menozzi, Roberto; Sozzi, Giovanna; Portesine, M; Pampili, P; Zani, P. E.
A new silicon resistor technology for very high power snubbers 1-gen-2005 Cova, Paolo; Sozzi, Giovanna; Menozzi, Roberto; Portesine, M.; Pampili, P.; Zani, P. E.
Electro-thermal simulation of semiconductor devices and hybrid circuits 1-gen-2006 Menozzi, Roberto; DE IACO, E; Sozzi, Giovanna; Cova, Paolo; Delmonte, Nicola; Zampardi, P; Kwok, K; Cismaru, C; Metzger, A.
Measurement of the thermal resistance of AlGaN/GaN HEMTs 1-gen-2007 Menozzi, Roberto; G. A., UMANA MEMBRENO; B. D., Nener; G., Parish; Sozzi, Giovanna; L., Faraone; U., Mishra
A review of the use of electro-thermal simulations for the analysis of heterostructure FETs 1-gen-2007 Sozzi, Giovanna; Menozzi, Roberto
Compact thermal modeling of GaN-Based Structures using Spice. 1-gen-2008 Bertoluzza, F; Costi, F; Delmonte, Nicola; Menozzi, Roberto; Sozzi, Giovanna
Finite-element thermal modeling of GaN-based HEMT structures 1-gen-2008 Costi, F.; Bertoluzza, F.; Delmonte, Nicola; Sozzi, Giovanna; Menozzi, Roberto
Temperature-dependent characterization of AlGaN/GaN HEMTs: thermal and source/drain resistances 1-gen-2008 Menozzi, Roberto; UMANA MEMBRENO, G. A.; Nener, B. D.; Parish, G.; Sozzi, Giovanna; Faraone, L.; Mishra, U. K.
Lumped element thermal modeling of GaN-based HEMTs 1-gen-2009 Bertoluzza, Fulvio; Sozzi, Giovanna; Delmonte, Nicola; Menozzi, Roberto
Hybrid large-signal/lumped-element electro-thermal modeling of GaN-HEMTs 1-gen-2009 F., Bertoluzza; Sozzi, Giovanna; Delmonte, Nicola; Menozzi, Roberto
Numerical analysis of the effect of grain size and defects on the performance of CIGS solar cells 1-gen-2010 Sozzi, Giovanna; Troni, Fabrizio; Menozzi, Roberto
Modeling of thin-film Cu(In,Ga)Se2 solar cells 1-gen-2010 Troni, Fabrizio; F., Dodi; Sozzi, Giovanna; Menozzi, Roberto
Compact modeling of GaN HEMTs including temperature- and trap-related dispersive effects 1-gen-2010 D., Mari; Bernardoni, Mirko; Sozzi, Giovanna; Menozzi, Roberto; G. A., Umana Membreno; B. D., Nener
Empirical investigation on device-degradation indicators under nonlinear dynamic regime 1-gen-2010 A., Raffo; S., Di Falco; Sozzi, Giovanna; Menozzi, Roberto; D. M. M. P., Schreurs; G., Vannini
Analysis of the gate current as a suitable indicator for FET degradation under nonlinear dynamic regime 1-gen-2011 A., Raffo; S., Di Falco; Sozzi, Giovanna; Menozzi, Roberto; D. M. M. P., Schreurs; G., Vannini
A numerical study of the design of ZnMgO window layer for Cadmium-free thin-film CIGS solar cells 1-gen-2011 Troni, Fabrizio; Sozzi, Giovanna; Menozzi, Roberto
A physical large-signal model for GaN HEMTs including self-heating and trap-related dispersion 1-gen-2011 D., Mari; Bernardoni, Mirko; Sozzi, Giovanna; Menozzi, Roberto; G. A., Umana Membreno; B. D., Nener
Mostrati risultati da 21 a 40 di 86
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